Electroplating_Fab Solutions_yuray-tech

Electroplating

YURAY delivers high-precision electroplating services for advanced packaging and interconnect applications. From copper pillar plating and bump formation to RDL and pad metallization, our plating platform ensures uniform deposition, precise dimensional control, and reliable metallurgical quality — supporting TSV, micro-bump, flip-chip, and 2.5D/3D integration.

10:1
Aspect Ratio
< 3%
CD Uniformity
< 5%
Thickness Uniformity
4 – 12"
Wafer Size

OVERVIEW

YURAY provides comprehensive electroplating solutions covering copper pillar plating, solder bump formation, RDL metallization, and pad plating. From seed-layer deposition and photoresist patterning to precision electroplating, photoresist stripping, and CMP planarization, our full-flow plating platform supports 4- to 12-inch wafers with tight uniformity control, high aspect-ratio filling capability, and reliable metallurgical performance for advanced packaging, flip-chip, TSV, and 2.5D/3D integration applications.

SERVICES

Our electroplating platform enables high-precision metallization for advanced packaging and interconnect structures — from fine-pitch copper pillars and solder bumps to redistribution layers and under-bump metallurgy.

Cu Pillar Plating

High-precision copper pillar electroplating with uniform height and diameter control across the wafer. Optimized for fine-pitch flip-chip, TSV reveal, and advanced packaging interconnects with excellent coplanarity and reliable metallurgical quality.

TECHNICAL SPECIFICATIONS
Parameter Specification
Wafer Size4 / 6 / 8 / 12 inch
Aspect RatioUp to 10:1
CD Uniformity< 3% (within wafer)
Thickness Uniformity< 5% (within wafer)
Pillar Diameter10 μm – 100 μm
Pillar Height5 μm – 100 μm
MaterialCu / Cu + SnAg cap

CASE STUDY

At YURAY, we provide end-to-end full-chain services. Below is a detailed look at how we translate stringent customer Statement of Work (SOW) requirements into delivered, proven plating results.

[[end-to-end service]]

RDL Copper Plating on Glass Interposer

Service Chain
01
Material Supply6-inch glass interposer substrate, glass cleaning, surface treatment, and adhesion layer.
02
Seed Layer StackPVD Ti/Cu seed layer stack deposition.
03
RDL PlatingPhotolithography + copper electroplating with parameter optimization and uniformity tuning.
04
CMP PlanarizationCMP planarization of RDL copper for flat surface.
05
MetrologySEM cross-section, profilometry, and sheet resistance mapping.
06
Report & Customer ApprovalSEM images, profile data, and process records; final characterization report delivered.
6-INCH GLASS 5/5 µm L/S RDL THICKNESS UNIFORMITY < 5% Ra < 5 nm RMS
[[end-to-end service]]

Fine-Pitch Cu Pillar Plating on 8-inch Wafer

Service Chain
01
Material Supply8-inch silicon wafer with under-bump metallization, incoming wafer inspection and process planning.
02
Seed Layer DepositionPVD Cu seed layer deposition for electroplating base.
03
Cu Pillar PlatingPhotolithography patterning + electroplating with time and current density optimization.
04
Solder Cap PlatingSnAg solder cap plating on top of Cu pillars.
05
MetrologyOptical profilometry and SEM inspection.
06
Report & Customer ApprovalConsolidated plating data, images, and analysis; final characterization report delivered.
8-INCH WAFER 50 µm PITCH / 25 µm CD HEIGHT UNIFORMITY < 3% SnAg CAP 15 µm


METROLOGY & QUALITY ASSURANCE

Reliable Deposition Quality, Complimentary Characterization Included At YURAY, deposition service means more than simply depositing a film. We combine qualified equipment, controlled processes, experienced engineering support, and rigorous quality management to deliver stable, repeatable thin-film performance. Every project can be supported with a free comprehensive characterization report, providing customers with transparent and actionable quality data. Depending on the service requirements, reports may include film thickness, uniformity, surface condition, adhesion, composition, and other relevant characterization results. Choose YURAY for high-quality film deposition, responsive technical support, and verified results—without additional reporting costs

SOW Requirements

Quantified SOW Requirements

YURAY converts SOW requirements into measurable criteria, defining clear quality targets and inspection standards.

Process Improvement

Continuous Process Improvement

YURAY identifies root causes of issues, such as interface peeling, and implements effective corrective solutions.

Characterization Reports

SOW-Aligned Characterization Reports

YURAY delivers characterization reports with indicators directly aligned to SOW requirements for transparent verification.

Third-Party Confirmation

Third-Party Double Confirmation

YURAY uses independent third-party laboratories to double-confirm critical indicators through characterization and inspection.



Need a Custom Wafer or Fabrication Process?

Share your drawings, wafer specifications, or project requirements — our engineering team will prepare a technical proposal and quote within one business day.